High-resolution secondary ion mass spectrometry reveals the contrasting subcellular distribution of arsenic and silicon in rice roots
Moore, K. L., Schroder, M., Wu, Z., Martin, B. G. H., Hawes, C. R., McGrath, Steve
, Hawkesford, Malcolm
, Ma, J. F., Zhao, Fangjie and Grovenor, C. R. M.
(2011)
High-resolution secondary ion mass spectrometry reveals the contrasting subcellular distribution of arsenic and silicon in rice roots.
Plant Physiology, 156.
pp. 913-924.
10.1104/pp.111.173088
| Item Type | Article |
|---|---|
| Open Access | Not Open Access |
| Project | SEF, Centre for Crop Genetic Improvement (CGI), Trace element dynamics in soils and plant uptake, Optimising nutrient use in cereals |
| Date Deposited | 05 Dec 2025 09:44 |
| Last Modified | 19 Dec 2025 14:33 |
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ORCID: https://orcid.org/0000-0003-0952-8947
ORCID: https://orcid.org/0000-0001-8759-3969

