A - Papers appearing in refereed journals
Wallenstein, S., Yates, F. and Aitkin, M. 1982. Regression Models for Repeated Measurements. Biometrics. 38 (3), pp. 849-853. https://doi.org/10.2307/2530064
Authors | Wallenstein, S., Yates, F. and Aitkin, M. |
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Year of Publication | 1982 |
Journal | Biometrics |
Journal citation | 38 (3), pp. 849-853 |
Digital Object Identifier (DOI) | https://doi.org/10.2307/2530064 |
Open access | Published as non-open access |
Publisher | Wiley |
ISSN | 0006-341X |
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