Atomic-force microscopy of plant chromosomes

A - Papers appearing in refereed journals

Winfield, M., Mcmaster, T. J., Karp, A. and Miles, M. J. 1995. Atomic-force microscopy of plant chromosomes. Chromosome Research. 3 (2), pp. 128-131. https://doi.org/10.1007/bf00710674

AuthorsWinfield, M., Mcmaster, T. J., Karp, A. and Miles, M. J.
Abstract

Atomic force microscopy has been used to image plant chromosomes from standard preparations without staining or coating. This has enabled the collection of high-resolution three-dimensional data on surface structure. The technique has been further applied to the imaging of C-banded chromosomes revealing structural changes resulting from the banding treatment. The bands were observed as localized areas of high relief.

Keywordsafm; atomic force microscopy; c-banding; plant chromosomes; scanning electron-microscopy; karyotype
Year of Publication1995
JournalChromosome Research
Journal citation3 (2), pp. 128-131
Digital Object Identifier (DOI)https://doi.org/10.1007/bf00710674
Open accessPublished as non-open access
FunderBiotechnology and Biological Sciences Research Council
ISSN09673849

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