Atomic-force microscopy of plant chromosomes

A - Papers appearing in refereed journals

Winfield, M., Mcmaster, T. J., Karp, A. and Miles, M. J. 1995. Atomic-force microscopy of plant chromosomes. Chromosome Research. 3 (2), pp. 128-131.

AuthorsWinfield, M., Mcmaster, T. J., Karp, A. and Miles, M. J.

Atomic force microscopy has been used to image plant chromosomes from standard preparations without staining or coating. This has enabled the collection of high-resolution three-dimensional data on surface structure. The technique has been further applied to the imaging of C-banded chromosomes revealing structural changes resulting from the banding treatment. The bands were observed as localized areas of high relief.

Keywordsafm; atomic force microscopy; c-banding; plant chromosomes; scanning electron-microscopy; karyotype
Year of Publication1995
JournalChromosome Research
Journal citation3 (2), pp. 128-131
Digital Object Identifier (DOI)
Open accessPublished as non-open access
FunderBiotechnology and Biological Sciences Research Council

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